3 |
? |
- |
Measurement of RF Pulse Carrier Frequency |
6 |
? |
- |
Homodyne Generator and Detection System |
6-65 |
1965? |
69XX |
DC Power Supplies - Harrison/HP |
7 |
? |
430C |
Hewlett-Packard Model 430C Microwave Power Meter Accuracy |
9 |
? |
490A |
Doppler Frequency Shit Simulation at Microwave Frequencies using Traveling Wave Tube Amplifier |
10 |
? |
- |
Microwave Spectrum Synthesis with the Traveling-Wave Tube |
11 |
1955 |
- |
Domesticating the Traveling Wave Tube |
12 |
1959 |
- |
How a Helix Backward-Wave Tube Works |
14 |
1955 |
49X |
Traveling-Wave Tube Amplifiers |
16 |
1964 |
- |
Waves on Transmission Lines |
17 |
1966 |
- |
Square Wave & Pulse Testing of Linear Systems |
18 |
1959 |
- |
Introduction to Solid State Devices |
20 |
1961 |
612A |
Signal Generator Output Attenuators |
20 |
1965 |
612A |
HP Signal Generator Output Attenuators |
21 |
1961 |
- |
Microwave Standards Prospectus |
24 |
? |
- |
Pulse Modulation of Audio Oscillators |
25 |
1961 |
120-130-1XX |
Cathode Ray Tube Phosphors and the Internal Graticule Cathode Ray Tube |
29 |
? |
- |
A Convenient Method for Measuring Phase Shift (With CRT Graticul Mask) |
30 |
1964 |
608-803-417 |
Measurement of Cable Characteristics |
31 |
? |
202A |
Externally Driving the 202A Low Frequency Function Generator |
32 |
1963 |
50X-56X |
Guide for Selecting HP and DYMEC Digitizing Instruments for Specific Applications |
36 |
? |
- |
Sampling Oscillography |
37 |
1959 |
120A-130A |
Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope |
38 |
1962 |
- |
Microwave Measurements for Calibration Laboratories |
41A |
1960 |
405AR |
A Hold-Off Circuit for the Model 405AR Digital Voltmeter |
41B |
1960 |
405AR |
Increased Resolution for Permanent Records of DC Voltage with hp Model 405AR |
41D |
1960 |
405AR |
Decreasing the Response Time of the Model 405 Input Filter |
43 |
1960 |
344A |
Continious Monitoring of Radar Noise Figure |
44A |
1960 |
185A |
Synchronizing the hp 185A Oscilloscope |
44B |
1960 |
185A |
More Information and Easier Pulse Analysis with the Model 185A Oscilloscope |
44D |
? |
18X |
Characteristics and Use of hp Sampling Oscilloscope Probe and Accessories |
45 |
1963 |
428A |
Direct Reading Test Meter Simplifies Magnetic Ink Printing Quality Control |
47 |
1961 |
524C-D |
Providing 100-, 1,000-, and 10,000-Second Gate Times for the hp Model 524C/D Counter |
48 |
1965 |
218A |
Applications of the hp Model 218A, a Versatile General-Purpose Pulse and Delay Generator |
52 |
1965 |
5060A ++ |
Frequency and Time Standards |
52-1 |
1974 |
- |
Fundamentals of Time and Frequency Standards |
52-2 |
1975 |
- |
Timekeeping and Frequency Calibration |
53 |
1962 |
185B |
Transmission Line Testing Using the Sampling Oscilloscope |
55 |
1962 |
302A |
Converting the Model 302A Wave Analyzer for Use with Grounded-Input Recorders |
56 |
1967 |
- |
Microwave Mismatch Error Analysis |
57 |
1965 |
34X |
Noise Figure Primer |
57-1 |
1983 |
8970A |
Fundamentals of RF and Microwave Noise Figure Measurements |
57-1 |
2000 |
859X-NFA |
Agilent Fundamentals of RF and Microwave Noise Figure Measurements |
57-2 |
1988 |
8970B |
Noise Figure Measurement Accuracy |
57-3 |
2000 |
- |
10 Hints for Making Successful Noise Figure Measurements |
58 |
1963 |
8714A |
The PIN Diode as a Microwave Modulator |
58 |
1967 |
- |
The PIN Diode as a Microwave Modulator |
59 |
1965 |
310-1110A |
Loop Gain Measurement with hp Wave Analyzers |
60 |
1967 |
4XX-34XX |
Which AC Voltmeter ? |
62 |
1964 |
1415A |
Time Domain Reflectometry |
62 |
1988 |
54120T |
TDR Fundamentals - For Use with hp 54120T Digitizing Oscilloscope and TDR |
62-1 |
1988 |
54120T |
Improving Time Domain Network Analysis Measurements |
62-2 |
1990 |
54120 |
TDR Technics for Differential Systems |
62-3 |
1990 |
541XX |
Advanced TDR Technics |
63 |
1968 |
8551A |
Spectrum Analysis |
63A |
1967 |
8551A |
More on Spectrum Analysis |
63B |
1968 |
8441A |
The 8441A Preselector : Advancement in the Art of Spectrum Analysis |
63C |
? |
8551A |
Measurement of White Noise Power Density |
63D |
1968 |
8551A-8406A |
Accurate Frequency Measurement: An Application of Spectrum Analysis |
63E |
1969 |
8551A |
Modern EMI Measurements |
63E-1 |
1978 |
- |
Quasi-Peak Measurements Using a Spectrum Analyzer |
63E-1 |
? |
- |
Quasi-Peak Measurements Using a Spectrum Analyzer - Corrective of AN63E-1 Above |
64 |
1965 |
43X |
Microwave Power Measurement |
64 |
1968 |
43X |
Microwave Power Measurement |
64-1 |
1977 |
43X |
Fundamentals of RF and Microwave Power Measurements |
64-1A |
1997 |
EPM-44X |
Fundamentals of RF and Microwave Power Measurements |
64-2 |
1978 |
436A |
Extended Applications of Automatic Power Meters |
64-3 |
1980 |
436A-346A |
Accurate and Automatic Noise Figure Measurements |
64-4A |
1997 |
EPM-44X |
4 Steps for Making Better Power Measurements |
65 |
1965 |
690C-D |
Swept Frequency Techniques |
66 |
1965 |
690 |
Swept SWR Tests in X-Band Coax |
67 |
1968 |
1415A-1815B |
Cable Testing with Time Domain Reflectometry (With TDR Slide Rule) |
68 |
1965 |
8614-8616B |
Accurate Receiver Sensitivity Measurements |
69 |
1965 |
34XX ++ |
Which DC Voltmeter |
70 |
1969 |
740-741B |
Precise DC Measurements |
71 |
1966 |
606-608 |
Advances in RF Measurements Using Modern Signal Generators 50Kc-480Mc |
72 |
1966 |
5201L-5551A |
Integral Counting |
73 |
1966 |
5201L-5551A |
Calibration of a Gamma Ray Spectrometer |
75 |
1966 |
1415A |
Selected Articles on Time Domain Reflectometry Applications |
76 |
1967 |
230A |
Using the 230A Power Amplifier |
77-1 |
1967 |
8405A |
Transistor Parameter Measurements |
77-2 |
1966 |
8405A |
Precision Frequency Comparison |
77-3 |
1967 |
8405A |
Measurement of Complex Impedance 1-1000 MHz |
77-4 |
1968 |
8405A |
Swept-Frequency Group Delay Measurements |
78-1 |
1966 |
DYMEC-2801 |
Calibrating the Quartz Thermometer |
78-2 |
1966 |
DYMEC-2801 |
Molecular Weight Determination with the Quartz Thermometer |
78-3 |
1968 |
HP2801A |
Calorimetry and the Quartz Thermometer |
78-4 |
1968 |
HP2801A |
A Glossary of Terms Pertaining to Temperature Measurements |
78-5 |
1971 |
HP2801A |
Applications of the Quartz Crystal Thermometer |
81 |
1967 |
203A |
Low Frequency Phase Shift Measurement Techniques |
82 |
1966 |
- |
Power Supply/Amplifier Concepts and Modes of Operation |
83 |
1966 |
- |
Increased Output Resistance for DC Regulated Power Supplies |
84 |
1967 |
1416A |
Swept SWR Measurement in Coax |
85 |
1966 |
5280A |
Using a Reversible Counter |
86 |
1968 |
4800A-4815A |
Using the Vector Impedance Meters |
87 |
1967 |
5210A |
FM and PM Measurements |
89 |
1967 |
3960-3968 |
Magnetic Tape Recording Handbook |
90 |
1967 |
HP-HARRISON |
DC Power Supply Handbook |
90B |
1978 |
HP-Only |
DC Power Supply Handbook |
91 |
1968 |
8405A |
How Vector Measurements Expand Design Capabilities 1 to 1000 Mhz |
92 |
? |
8410 |
Network Analysis at Microwave Frequencies |
93 |
1969 |
540X |
Statistical Analysis of Waveforms and Digital Time-Waveform Measurements |
93 |
? |
5400A |
Electronic Application of the 5400A (Technical Information Note 93) |
94 |
1968 |
- |
Connector Design Employing TDR Techniques |
95 |
1968 |
8410 ++ |
S-Parameters… Circuit Analysis and Design |
95A |
1973 |
- |
Selected Reprints on S-Parameters… Circuit Analysis and Design |
95-1 |
? |
- |
S-Parameter Techniques for Faster, More Accurate Network Design (Paper part of AN95) |
96 |
1969 |
5105-5110B |
HP Direct-Type Frequency Synthesizers Theory, Performance and Use |
98-1 |
? |
3722A |
Noise at Work - Model 3722A Aids Design of Process Control Systems |
98-2 |
1969 |
H01-3722A |
Noise at Work - A Point by Point Correlator for the H01-3722A |
99 |
1968 |
8541A |
8541A Automatic Network Analyzer Measurement Capabilities |
100 |
1968 |
- |
Acoustics Hanbook |
101 |
1963 |
7560-7561A |
Multiplication and Division by Logarithms (HP-Moseley Division) |
102 |
1963 |
7000-7100 |
Program Controllers (HP-Moseley Division) |
105 |
1961 |
MOSELEY |
Polarography |
105 |
1967 |
- |
Polarography (HP-Moseley Division) |
106 |
1967 |
135-Moseley |
Electric Motor Testing Performance (HP-Moseley Division) |
107 |
1965 |
- |
Guard Circuits (HP-Moseley Division) |
108 |
1966 |
101-Moseley |
Hysteresis Curve Plotting (HP-Moseley Division) |
109 |
1969 |
62XX |
Power Supply Overvoltage "CROWBARS" |
110 |
1968 |
8410 |
Anrenna/Radome Boresight Error Measurements |
112-1 |
1968 |
675-676A |
Low-Frequency Network Analysis with the 675A/676A |
112-2 |
1969 |
675-676A |
Using the 675A/676A Network Analyzer as an Educational Tool |
114 |
1969 |
653A |
A2A Video Transmission System Alignment |
115 |
1970 |
- |
Principles of Cathode-Ray Tubes, Phosphors, and High-Speed Oscillography |
116 |
1969 |
5360A |
Precision Frequency Measurements |
117-1 |
1970 |
8410 |
Microwave Network Analyzer Applications |
117-2 |
1971 |
8410-11608A |
Stripline Component Measurements with the 8410A Network Analyzer |
118 |
1970 |
1815A |
Dielectric Measurements with Time Domain Reflectometry |
120 |
1969 |
5360A |
A New Technique for Pulsed RF Measurements |
120-2 |
1970 |
5360A |
Measuring Phase with the 5360A Computing Counter |
120-3 |
1970 |
5360A |
Non-Linear Systems Applications of the Computing Counter System |
121-1 |
1970 |
8407A |
Network Analysis with the HP 8407A 0,1 - 110 MHz |
121-2 |
1970 |
8407A |
Swept Impedance with the HP 8407A 0,1 - 110 MHz |
123 |
1970 |
- |
Floating Measurements and Guarding |
124 |
1970 |
- |
True RMS Measurements |
125 |
1970 |
3480B-2912A |
Data Acquisition - 3480B Digital Voltmeter - 2912A Scanner - 2547A Coupler |
126 |
1970 |
3590A |
Theory and Applications of Wave Analyzers |
127 |
1970 |
5480B |
Signal Averaging Enhancement of RF and Pulse Measurements |
128 |
1970 |
6177B-618XB |
Applications of a DC Constant Current Source |
129 |
? |
- |
Logic Timing Measurements |
130 |
1970 |
2570A |
Instrumentation Control with the HP Coupler/Controller |
131 |
1971 |
2570-2575A |
Time-Sharing Based Instrumentation Terminal |
132 |
1971 |
2570A-9100 |
Calculator Based Instrumentation Systems |
133-1 |
1971 |
3480-180A |
Low Frequency Pulse Amplitude Measurements |
133-2 |
1971 |
3485A |
A Guide to Remote Control of the 3485A Scanning Unit |
133-3 |
1971 |
3480-2070A |
A Guide to Using Data Storage |
133-4 |
1972 |
3480-2070A |
A Guide to Using Sample-and-Hold |
134 |
1971 |
8556A-8552B |
Audio Frequency Measurements with the 8556A-8552B Spectrum Analyzer |
135-1 |
1971 |
2116 ++ |
Computerized Data Acquisition Aids Final Testing |
135-2 |
1971 |
2116 ++ |
High-Volume Production Testing |
135-3 |
1971 |
2116 ++ |
Process Monitoring in Manufacturing |
135-4 |
1971 |
2116 ++ |
Closed-Loop Production Testing |
135-5 |
1971 |
2116 ++ |
A Mobile Process Control Laboratory |
135-6 |
1971 |
2116 ++ |
Computer Analysis Aids Battery Testing |
135-7 |
1971 |
2114-2116 ++ |
Data Acquisition and Analysis at Sea |
135-8 |
1971 |
2116 ++ |
Minicomputer System Aids Busy Psychology Lab |
135-9 |
1971 |
2116 ++ |
In-Flight Data Analysis Improves Airborne Research |
135-10 |
1971 |
2114 ++ |
Computer Speeds Gas Turbine Combustor Testing |
135-11 |
1971 |
2116 ++ |
Stable Measurements on the High Seas |
135-12 |
1971 |
2116 ++ |
Depot Testing of Avionic Modules |
135-13 |
1973 |
2116 ++ |
Domestic Communications Satellites - A World's First |
135-14 |
1972 |
2115 ++ |
Computerized Process Control Improves Sugar Refinery Production |
135-15 |
1972 |
2116 ++ |
Minicomputer System Benefits Fuel Cell Technology |
135-16 |
1972 |
2116 ++ |
Minicomputer Systems Aid Military Vehicle Testing |
135-17 |
1972 |
2116 ++ |
Testing Ovonic Read-Mostly Memories |
135-18 |
? |
2100A ++ |
An Automated Engine Laboratory in a Research Environment |
135-19 |
1972 |
2116 ++ |
Testing Thick-Film Hybrid Circuits |
135-21 |
1973 |
9500 ++ |
Viggen Avionic Support |
135-22 |
1973 |
2100 ++ |
Real-Time Multiprogramming System Boosts Productivity for NCR |
135-23 |
1973 |
9500 ++ |
Television Set Production Revolutionized by Automatic Alignment and Test |
135-24 |
1973 |
2100A ++ |
Automated System Improves Spacecraft Testing |
135-25 |
1973 |
2116 ++ |
Automation in Production Testing |
136 |
1973 |
8445B-8555A |
Understanding and Operating the 8555A Spectrum Analyzer and 8445B Preselector |
137 |
1971 |
4470A |
Probing Transistor Noise |
138 |
1971 |
5401B |
Multichannel Analyzer Applications |
139 |
1971 |
5586A |
Stabilizing Gamma-Ray Spectrometer Systems with the HP 5586A Spectrum Stabilizer |
140-0 |
? |
5450 |
Fourier Analayser Training Manual |
140-1 |
1971 |
5450 |
Detecting Sources of Vibration and Noise Using HP Fourier Analyzers |
140-2 |
1971 |
5450 |
Feedback Loop and Servomechanism Measurements Using HP Fourier Analyzers |
140-3 |
1972 |
5451 |
Dynamic Testing of Mechanical Systems Using Impulse Testing Techniques |
140-4 |
? |
5451 |
Digital Auto-Power Spectrum Measurements |
140-5 |
1973 |
5451 |
Measurement of Transfer Functions with Wide Dynamic Range |
140-6 |
1973 |
5451 |
Measurement of Machine Tool Vibration |
140-7 |
1974 |
5451 |
Nuclear Power Plant Diagnostics Using Fourier Analysis Techniques |
141 |
1971 |
5257A |
AM, FM Measurements with the Transfer Oscillator |
142-XX |
1968 |
8551 |
EMI Measurement Procedure (With 8551 Calibration Slide Rule) |
142 |
1972 |
855X |
EMI Measurement Procedure |
144 |
? |
- |
Understanding Microwave Frequency Measurements |
145-1 |
1971 |
2000C |
First Small Computer Solution to Text Editing Systems |
145-2 |
1971 |
2114 |
Minicomputer Untangles Massive Inventory Problem in Heavy Industry |
145-3 |
1971 |
2116B |
Flexible Computer-Controlled Laser System Revolutionizes Garment Industry |
145-4 |
1971 |
2000C |
Inexpensive Time-Share System Solves Unique College Registration Problems |
145-5 |
1971 |
2000C |
Computer System Helps Graduate Business School Teach Management Technology |
145-6 |
1972 |
2000C |
Dedicated Time-Sharing Fills Multitude of Management Needs |
145-7 |
1972 |
2000B |
Computer System Helps Motivate High School Students |
145-8 |
1972 |
- |
Minicomputer Systems Improve Auto Maker's Production Efficiency |
145-9 |
1972 |
2120A |
Low-Cost Batch System Streamlines Construction Projects |
145-9 |
1973 |
2100 |
Microprogrammable Mini Expand University Computer Science Program |
145-10 |
1972 |
2100A |
Rugged Minicomputer System Helps Ships Find the Sure, Safe Way |
145-11 |
1972 |
2000X |
Time-Shared Systems Expand Scope of Education |
145-12 |
1972 |
2000 |
Inexpensive Computer System "Does it All" for Small Manufacturer |
145-13 |
1972 |
2000 |
Computer Systems Raise Student Achievement Levels |
145-14 |
1972 |
2100 |
Small Computer System Pinpoints Suspects for Police Departments |
145-15 |
1973 |
2000 |
Computer Systems Help University Provide Quality, Personalized Instruction |
145-16 |
1973 |
2100 |
Small Computer System Keeps Apparel Industry in Style |
145-17 |
1973 |
2000 |
Versatile Computer Systems Streamlining Hawaiian Industry |
145-18 |
1973 |
2100 |
Small Computer System Keeps Meteorologists on Top of the Weather |
145-19 |
1973 |
200X |
Small System Provides Bank with Versatile New Problem-Solver |
145-20 |
1973 |
2100 |
Efficient Computer Systems Help Firm Maintain Competitive Edge |
145-25 |
1974 |
200X |
Computer Network Connects Field Offices and Manufacturing Divisions |
150 |
1974 |
855X |
Spectrum Analysis…. Spectrum Analyzer Basics |
150 |
1989 |
70XXX |
Spectrum Analysis…. Spectrum Analyzer Basics |
150A |
1973 |
8558B |
Spectrum Analysis…. Using the 8558B Spectrum Analyzer |
150B |
1978 |
8557A-8558B |
Spectrum Analysis…. Using the 8557A and 8558B Spectrum Analyzers |
150-1 |
1971 |
855X |
Spectrum Analysis Amplitude and Frequency Modulation |
150-1 |
1989 |
- |
Spectrum Analysis Amplitude and Frequency Modulation |
150-2 |
1971 |
855X |
Spectrum Analysis…. Pulsed RF (With Pulsed RF Calculator Slide Rule) |
150-3 |
1974 |
855X-8444A |
Spectrum Analysis…. Swept Frequency Measurements and Selective Frequency Counting with a Tracking Generator |
150-4 |
1974 |
855X |
Spectrum Analysis…. Noise Measurements |
150-5 |
1973 |
855X |
Spectrum Analysis…. CRT Photography and X-Y Recording Techniques |
150-6 |
1974 |
855X |
Spectrum Analysis…. CATV Proof of Performance |
150-7 |
1975 |
855X |
Spectrum Analysis…. Signal Enhancement |
150-8 |
1976 |
855X |
Spectrum Analysis…. Accuracy Improvement |
150-9 |
1976 |
855X |
Spectrum Analysis…. Noise Figure Measurement |
150-10 |
1976 |
855X |
Spectrum Analysis…. Field Strength Measurement |
150-11 |
1976 |
855X |
Spectrum Analysis…. Distorsion Measurement |
150-12 |
1977 |
8565A-11517A |
Spectrum Analysis…. Using the HP 11517A External Mixer to 40 GHz |
150-13 |
1978 |
8565A-8709A |
Stimulus-Response Measurements… Using the HP 8565A Spectrum Analyzer from 2-18 GHz |
150-14 |
1978 |
855X |
Spectrum Analysis…. Using External Waveguide Mixers Above 40 GHz |
151 |
1973 |
- |
Fundamentals of Air Navigational Systems |
152 |
1972 |
- |
Probing in Perspective |
153 |
1972 |
1415A-1815A |
Permeability, Permittivity and Conductivity Measurements with Time Domain Reflectometry |
153-1 |
1997 |
815X |
The Basics of Fiber Optic Measurement and Calibration |
154 |
1972 |
8410 ++ |
S-Parameter Design |
154 |
1990 |
8510-875X |
S-Parameter Design |
155-1 |
1976 |
8755 ++ |
Active Device Measurements with the HP 8755 Frequency Response Test Set |
155-2 |
1977 |
8755 ++ |
100 dB Dynamic Range Measurements Using the HP 8755 Frequency Response Test Set |
155-3 |
1981 |
8755S |
Automating the HP 8755 Scalar Network Analyzer |
156-1 |
? |
5526A |
Laser Measurement System - Remote Laser Interferometry |
156-2 |
? |
5526A |
Laser Measurement System - Calibration of a Surface Plate |
156-3 |
1972 |
5510A |
Laser Measurement System - Principles of Automatic Compensation |
156-4 |
? |
5526A |
Laser Measurement System - Calibration of a Machine Tool |
156-4 |
? |
5526A |
Système de Mesure à Laser - Etalonnage d'une Machine Outil (French Translation of AN 156-4) |
156-5 |
1976 |
5526A |
Laser Measurement System - Measurement of Straightness of Travel |
156-5 |
1979 |
5526A |
Système de Mesure à Laser - Mesure de la Rectitude d'un Déplacement (French Translation of AN 156-5) |
157 |
? |
3570-3575 ++ |
Low Frequency Gain Phase Measurements |
158 |
1973 |
34XX ++ |
Selecting the Right DVM |
162-1 |
? |
5326-5327 |
Time Interval Averaging |
163-1 |
1973 |
105XX |
Techniques of Digital Troubleshooting |
163-2 |
? |
161X-500X |
The IC Troubleshooters - New Techniques of Digital Troubleshooting |
164-1 |
1974 |
8660A-B |
Programming the 8660A/B Synthesized Signal Generator (Standard BCD Interface) |
164-2 |
1974 |
8660A-B |
Calculator Control of the 8660A/B/C Synthesized Signal Generator (Optional HP-IB Interface) |
164-3 |
1975 |
8660 |
New Techniques for Analyzing Phase Locked Loops |
164-4 |
1975 |
8660 |
Digital Phase Modulation (PSK) and Wideband FM… Using the 8660A/C Synthesized Signal Generator |
166 |
? |
131X-1321A |
Large Screen Display Applications and Interfacing |
166-2 |
? |
1304A |
Large Screen Display Applications and Interfacing (Supplement to AN 166) |
167-1 |
? |
5000A |
The Logic Analyzer |
167-2 |
? |
1601 |
Digital Triggering for Analog Measurements |
167-3 |
? |
1601 |
Functional Digital Analysis |
167-4 |
1975 |
1600A-1607A |
Engineering in the Data Domain Calls for a New Kind of Digital Instruments (Reprint from Electronics Magazine May 1/75) |
167-5 |
1975 |
1600A-1607A |
Troubleshooting in the Data Domain is Simplified by Logic Analyzers (Reprint from Electronics Magazine May 15/75) |
167-5 |
1975 |
1600A-1607A |
Le dépannage des Systèmes Travaillant dans le Domain des Etats est Simplifié par l'Emploi des Analyseurs Logiques |
167-6 |
? |
1600A |
Mapping a Dynamic Display of Digital System Operation |
167-7 |
? |
1600A |
Supplementary Data from Map Displays Without Changing Probes |
167-8 |
? |
1620A-7900A |
Stable Displays of Disc System Waveforms Synchronized to Record Address |
167-9 |
? |
1600A-1607A |
Functional Analysis of the Motorola M6800 Microprocessor System |
167-9 |
1976 |
1600A-1607A |
Analyse Fonctionnelle du Microprocesseur Motorola M6800 (French Translation of AN 167-9) |
167-10 |
? |
1620A |
Using the 1620A for Serial Pattern Recognition |
167-11 |
? |
1600A-1607A |
Functional Analysis of Intel 8008 Microprocessor Systems |
167-11 |
1976 |
1600A-1607A |
Analyse Fonctionnelle du Microprocesseur 8008 Intel (French Translation of AN 167-11) |
167-12 |
? |
1600A-1607A |
Functional Analysis of Fairchild F8 Microprocessor Systems |
167-12A |
? |
1600A-1607A |
Functional Analysis of Mostek F8 Microprocessor Systems |
167-13 |
? |
1740S |
The Role of Logic State Analyzers in Microprocessor Based Designs |
167-14 |
? |
1600A-1607A |
Functional Analysis of 8080 Microprocessor Systems |
167-14 |
1976 |
1600A-1607A |
Analyse Fonctionnelle du Microprocesseur 8080 (French Translation of AN 167-14) |
167-15 |
? |
1600A-1607A |
Functional Analysis of Intel 4040 Microprocessor Systems |
167-16 |
? |
1600A-1607A |
Functional Analysis of Intel 4040 Microprocessor Systems |
167-17 |
? |
1600A-1607A |
Functional Analysis of National IMP Microprocessor Systems |
167-18 |
? |
1600A-1607A |
Functional Analysis of National Semiconductor SC/MP Microprocessor System |
167-19 |
? |
1600A-1607A |
Systematic "turn-on" of Microprocessor Systems Using Logic State Analyzers |
170-1 |
? |
8640A-B |
HP 8640A/B Signal Generator Output Level Accuracy |
170-2 |
1975 |
8640A-B |
HP 8640A/B Signal Generator Third-Order Intermodulation Characteristics |
171-1 |
1974 |
8640-8405A |
Crystal Testing with the HP 8640A/B and HP 8405A |
171-2 |
1974 |
8640B |
Extending the 8640B Frequency Down to DC |
172 |
? |
- |
The Fundamentals of Electronic Frequency Counters |
173 |
1974 |
5340 ++ |
Recent Advances in Pulsed RF and Microwave Frequency Measurements |
173-1 |
1975 |
5345A |
Dynamic Measurement of Microwave Voltage Controlled Oscillators with the 5345A Electronic Counter |
174-0 |
? |
5345A |
Index to the AN 174 Application Notes Series |
174-1 |
? |
5345A |
Measuring the Transfer Characteristic of a Voltage Controlled Oscillator |
174-2 |
? |
5345A |
Measuring Differential Nonlinearity of a Voltage Controlled Oscillator |
174-3 |
? |
5345A |
Measuring Integral Nonlinearity of a Voltage Controlled Oscillator |
174-4 |
? |
5345A |
Measuring Dual VCO Tracking Error |
174-5 |
? |
5345A |
Determining Probability Densities (Histograms) with the 5345 Electronic Counter |
174-6 |
? |
5345A |
Measuring the Stability of a Frequency Source |
174-7 |
? |
5345A |
Measuring Fractional Frequency Deviation (Short Term Stability of Oscillators) |
174-8 |
? |
5345A |
Measuring FM Peak-to-Peak Deviation |
174-9 |
1974 |
5345A |
Making Automatic Phase Measurements with the 5345A Electronic Counter |
174-10 |
1974 |
5345A |
Measuring Electrical Length (Delay) of Cables |
174-11 |
1974 |
5345A-59308A |
Measuring Warm-Up Characteristics and Aging Rates of Crystal Oscillators |
174-12 |
1974 |
5345A-59308A |
Measuring Frequency Sweep Linearity of Sweep Generators |
174-13 |
1974 |
5345A-59308A |
Measuring the Tuning Step Transient Response of VCO's to 18 GHz |
174-14 |
1987 |
5345A |
Radar System Characterization and Testing Using the HP 5345A Electronic Counter |
175-1 |
1974 |
MLA |
Microwave Link Measurement - Differential Phase & Gain at Work |
176-8 to 16 |
? |
- |
Gas Chromatography / Mass Spectometry Application Notes Series |
181-1 |
1974 |
5340A |
Measuring Linearity of VCO's from 10 Hz to 23 GHz |
181-2 |
1974 |
5300B |
Data Acquisition with the 5300B Measuring System |
181-2 |
1986 |
535X |
Voltage-Contolled Oscillators Characterization |
183 |
1978 |
8755 ++ |
High Frequency Swept Measurements |
185 |
1974 |
1722A |
Waveform Parameter Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A |
185-2 |
? |
1722A |
Transmission Line Matching and Length Measurements Using the Microprocessor Controlled Oscilloscope Model 1722A |
185-3 |
? |
1722A |
Percent Amplitude Modulation Measurement in the Time Domain |
185-4 |
? |
1722A |
Elimination of Computation on Analog Measurements by Using the Direct Reading Oscilloscope Model 1722A |
186 |
? |
1722A |
Dual-Delayed Sweep for Precise Time Interval Measurements |
187-2 |
1975 |
8620-8709 ++ |
Configuration of a 2-18 GHz Synthesized Frequency Source Using the 8620C Sweep Oscillator |
187-3 |
1976 |
8755-8410 ++ |
Three HP-IB Configurations for Making Microwave Scalar Measurements |
187-4 |
1976 |
8620-8709 |
Configuration for a Two-Tone Sweeping Generator |
187-5 |
1976 |
8620-5340 |
Calculator Control of the 8620C Sweep Oscillator Using the Hewlett-Packard Interface Bus |
187-6 |
1979 |
8620-8709 ++ |
The Frequency Performance of the 8620C Sweep Oscillator Under Remote Programming |
188 |
? |
3050B |
Thermocouple Measurements with the 3050B |
190 |
1975 |
8620-8709 ++ |
40 GHz Frequency Measurement with Standard HP Instruments |
191 |
1976 |
534X-5363A |
Precision Time Interval Measurements Using an Electronic Counter |
191-1 |
1977 |
5359A-5363A |
Automatic Zero Calibration of the 5359A Time Synthesizer at a Designated Remote Location |
191-2 |
1977 |
5359A |
Determining Digital Circuit Timing Tolerance to Optimize Adjustment or Design |
191-3 |
1977 |
5370A |
Precision Time Interval Measurements in Radar Applications |
191-4 |
1978 |
5370A |
Using the 5370A Universal Time Interval Counter to Characterize Pulse Width, Repetition Rate and Jitter |
191-5 |
1980 |
5370A-5363B |
Measurement of Propagation Delays Using the 5370A Time Interval Counter and 5363B Time Interval Probes |
191-6 |
1980 |
5370A-5363B |
Precise Cable Length and Matching Measurements Using the 5370A Time Interval Counter and 5363B Time Interval Probes |
191-7 |
1987 |
5370B |
HP 5370B Universal Time Interval Counter - High-Speed Timing Acquisition and Statistical Jitter Analysis |
192 |
1975 |
358X-855X |
Using a Narrow Band Analyzer for Characterizing Audio Products |
195 |
1975 |
8011-8015 |
Pulse Generator Techniques in CMOS Applications |
196 |
1975 |
436A |
Automated Measurements Using the 436A Power Meter |
196-1 |
1979 |
432C |
Automated Power Measurements Using the 432C Power Meter - Including Waveguide and Fiber Optic Measurements |
197-1 |
1975 |
5501A |
Laser Interferometers for Position Feedback |
197-2 |
? |
5501A |
Laser and Optics |
198 |
1975 |
1230A |
Event-Related Triggering a Clear Solution for Digital Signals |
199 |
? |
133X |
Small Screen Displays Medical Diagnostic System Applications and Interfacing |
200 |
1978 |
53XX |
Fundamentals of the Electronic Counters |
200-1 |
1977 |
53XX |
Fundamentals of Microwave Electronic Counters |
200-2 |
? |
- |
Fundamentals of Quartz Oscillators |
200-3 |
? |
53XX |
Fundamentals of Time Interval Measurements |
200-4 |
? |
53XX |
Understanding Frequency Counter Specifications |
201-1 |
1976 |
2108A ++ |
Automatic Q-A Evaluation of Precision Resistors |
201-2 |
1976 |
2108A ++ |
Measuring Differential Non-Linearity of a Voltage-Controlled Oscillator |
201-3 |
1976 |
2113A ++ |
A Multiple Station Electronic Test System |
201-4 |
1977 |
HP1000 ++ |
Performance Evaluation of HP-IB Using RTE Operating Systems |
201-5 |
1977 |
HP1000 ++ |
The HP-IB Link: Control of Distributed HP-IB Devices |
201-6 |
1980 |
HP1000-9825 |
Computer Communications: HP 9825 - HP 1000 |
201-7 |
1978 |
HP1000-3455 |
High-Performance Software for the HP 3455A/3495A Subsystem |
201-8 |
1979 |
HP1000 ++ |
The Use of Device Subroutines with the HP 1000 Computers |
202-01 |
1976 |
2100S-7260A |
Optical Mark Reader Substantially Incease Productivity |
204-1 |
1977 |
3050B |
Automatic Accelerometer Calibration Helps Assure Air Dropped Cargo Survivability |
204-2 |
1977 |
3050 |
Energy Conservation in a Restaurant - Measurement / Computation Using Hewlett-Packard's Data Aquisition System |
205-1 |
1977 |
3042A |
Low Frequency Amplitude Considerations of 3042A System |
205-2 |
1979 |
3042A |
Sonar Transducer Calibration - Measurement and Computation with Hewlett-Packard's 3042A Automatic Network Analyzer System |
206-1 |
1977 |
3045A |
Measuring Wideband Noise with the HP 3045A Automatic Spectrum Analyzer |
207 |
1976 |
3045A |
Understanding and Measuring Phase Noise in the Frequency Domain |
210-1 |
? |
DTS-70 |
Digital Test System - Modeling and Simulation for Digital Testing |
210-4 |
? |
DTS-70 |
Digital Test System - Designing Digital Circuits for Testability |
212-1 |
1977 |
HP1000 |
Building an Inventory Control Data Base |
212-2 |
1977 |
HP1000 |
Building an Order Processing Data Base |
214-1 |
1977 |
704X |
Recording with Input Noise Present |
214-2 |
1977 |
704X |
X-Y Recorder Dynamic Response |
214-3 |
1977 |
704X |
X-Y Recorder Input Connection Configuration and Input Noise |
214-4 |
1977 |
704X |
High-Sensitivity X-Y Recorder Has Few Input Restrictions |
216 |
? |
3570A-3571A |
A Guide to the Use of HP3570A and 3571A Analyzers |
218-1 |
1977 |
8671A-8672A |
Applications & Performance of the 8671A and 8672A Microwave Synthesizers |
218-2 |
1977 |
8671A-8672A |
Obtaining Millihertz Resolution from the 8671A & 8672A |
218-3 |
1978 |
8660-8672A |
A 1 MHz to 18 GHz Signal Generator with 1, 2, or 3 Hz Resolution |
218-4 |
1979 |
8672-938-940A |
Synthesized Signals from 18 to 37,2 GHz Using the 8672A |
218-5 |
1981 |
8672A-11720A |
Obtaining Leveled Pulse-Modulated Microwave Signals from the HP 8672A |
219 |
1977 |
8505A |
HP 8505A RF Network Analyzer Basic Measurements |
220 |
1977 |
8565A |
Operating the HP 8565A Spectrum Analyzer |
221 |
1977 |
8410B-9825A |
Semi-Automatic Measurements Using the 8410B Microwave Network Analyzer and the 9825A Desk-Top Computer |
221A |
1980 |
8410B |
Automating the HP 8410B Microwave Network Analyzer |
222 |
1977 |
5004A |
Guide d'Utilisation de l'Analyse de Signature (French Translation of AN 222) |
222-1 |
? |
3060A |
Implementing Signature Analysis for Production Testing with the HP 3060A Board Test System |
222-2 |
1979 |
5004A |
Application Articles on Signature Analysis |
222-5 |
1982 |
500X-HP85 |
Increasing Productivity in Manufacturing and Service with a Logic Troubleshooting System |
222-6 |
1983 |
5006A |
Troublshooting with Composite Signatures |
222-11 |
1981 |
500X |
A Signature Analysis Case Study of a 6800-Based Display Terminal |
222-12 |
1982 |
|
A Signature Analysis Based Test System for ECL Logic |
223 |
? |
1600A-1741A |
Oscilloscope Measurements in Digital Systems |
224-1 |
1977 |
2240A |
An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Measurement and Control Examples |
222-4 |
1977 |
2240A |
An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Signal Conditioning: HP 22914A Card |
225 |
1978 |
5390A |
Measuring Phase Spectral Density of Synthesized Signal Sources Exhibiting F0 and F-1 Noise with the 5390A Freq. Stability Analyzer |
225-1 |
? |
5390A |
Measurement Considerations when Using the 5390A Option 010 |
226 |
1977 |
9850A-9825A |
Automatic Transceiver Testing with the 8950A |
227 |
1977 |
8016A |
Word Generator Techniques in Multi-Channel Applications |
229-1 |
1977 |
7221A |
HP-Plot/21 Software Conversion Guide |
231-1 |
1979 |
3779 |
Single Channel Codec Testing |
231-2 |
1983 |
3779 |
Codec Testing with the HP 3779C/D Primary Multiplex Analyzer |
231-3 |
1984 |
3779 |
Making Telecommunications Measurements in Complex Impedances |
233-1 |
1981 |
1610A |
Funtional Analysis of Signetics 2650 Microprocessor Systems Using the 1610A |
233-2 |
? |
1610A |
Funtional Analysis of TMS 9900 Microprocessor Systems Using the 1610A |
233-3 |
? |
1610A |
Funtional Analysis of Z80 Microprocessor Systems Using the 1610A |
233-4 |
? |
1610A |
Funtional Analysis of 8080 Microprocessor Systems Using the 1610A |
233-5 |
? |
1610A |
Funtional Analysis of 6800 Microprocessor Systems Using the 1610A |
233-7 |
1980 |
1610A-B |
Computer Performance Analysis Using the 1610A/B |
234-1 |
1977 |
8568A |
8568A Spectrum Analyzer Operation |
235 |
? |
654A-3320C |
An Introduction to Balanced Circuits and Impedance Matching |
236-1 |
1977 |
- |
A "MAKE" or "BUY" Analysis for Power Supplies |
236-2 |
1979 |
- |
Two Power Supply Redundancy Schemes |
236-4 |
1981 |
65000 |
EMI/RFI and HP 65000A Series Power Supplies - Meeting FCC and VDE Requirements for Computing Equipment |
238 |
1980 |
4140B |
Semiconductor Measurements with the HP 4140B Picoammeter / DC Voltage Source |
238-1 |
1981 |
4140B-HP85 |
Ultra Low Current Semiconductor DC Parameter Measurement System using HP 4140B |
240-0 |
1977 |
5420A |
Analyse Numérique de Signaux (French Translation of AN 240-0) |
240-1 |
? |
5420A |
Digital Signal Analysis - Feedback Control System Measurements |
240-1 |
1979 |
5420A |
Analyse Numérique de Signaux - Mesure sur les Systèmes Asservies (French Translation of AN 240-1) |
240-2 |
? |
5420A |
Improving the Accuracy of Structural Response Measurements |
240-2 |
? |
5420A |
Amélioration de la Précision des Mesures de Réponse de Structures Mécaniques (French Translation of AN 240-2) |
243 |
1994 |
3582A |
The Fundamentals of Signal Analysis |
243-1 |
1983 |
358X |
Effective Machinery Maintenance Using Vibration Analysis |
243-1 |
1994 |
3562 |
Effective Machinery Measurements Using Dynamic Signal Analyzers |
243-1 |
1983 |
358X |
Maintenance de Machines par l'Analyse de Vibration (French Translation of AN 243-1) |
243-2 |
1991 |
3562 |
Control System Development Using Dynamic Signal Analyzers |
243-2 |
1987 |
3562 |
Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2) |
243-3 |
1992 |
3562 |
The Fundamentals of Modal Testing |
243-4 |
1991 |
3562 |
Fundamentals of the Z-Domain and Mixed Analog/Digital Measurements |
243-5 |
1992 |
- |
Control System Loop Gain Measurements |
243-6 |
1992 |
3562-3577 |
Control System Measurement Fundamentals Using Dynamic Signal Analyzers and Accessories |
245-1 |
? |
3582A |
Signal Averaging with the 3582A Spectrum Analyzer |
245-2 |
? |
3582A |
Measuring the Coherence Function with the 3582A Spectrum Analyzer |
245-3 |
? |
3582A |
Third Octave Analysis with the 3582A Spectrum Analyzer |
245-4 |
1979 |
3582A |
Accessing the 3582A Memory with HP-IB |
245-5 |
1979 |
3582A |
Log Sweep with the 3582A Spectrum Analyzer |
246 |
1978 |
3585A |
Using the HP 3585A Spectrum Analyzer with the HP 9825A Computing Controller |
246-1 |
1979 |
3585A |
Optimizing the Dynamic Range of the HP 3585A Spectrum Analyzer |
246-2 |
1981 |
3585A |
Measuring Phase Noise with the HP 3585A Spectrum Analyzer |
250-1 |
1978 |
- |
HP-IB / Power Supply Interface Guide |
250-2 |
1979 |
- |
Battery Charging / Discharging (Lab & Industrial Power Sources) |
260-1 |
? |
1615A |
Understanding Hewlett-Packard's Model 1615A Logic Analyzer |
262 |
1978 |
1725A |
Eliminating Time-Base Errors from Oscilloscope Measurements |
263 |
? |
10023A |
Thermal Measurements of Electronic Components Using the Hewlett-Packard Temperature Probe |
270-1 |
1978 |
8568A |
An Example of Automatic Measurement of Conducted EMI with the HP 8568A Spectrum Analyzer |
270-2 |
1980 |
8568A |
Automated Noise Sideband Measurements Using the HP 8568A Spectrum Analyzer |
271-1 |
1978 |
1350A-9825A |
Adding Soft Copy Graphics to 9825A Based HP-IB Systems Using the Model 1350A Graphic Translator |
272 |
1978 |
1743A |
Precise Time Interval Measurements Using the Crystal Controlled Time Base Model 1743A Oscilloscope |
275 |
1979 |
1640A |
Symptomatic Troubleshooting of Computer Networks with the HP 1640A |
275-1 |
1979 |
1640A |
Using the HP 1640A Serial Data Analyzer with the Epitape Recorder |
275-2 |
1979 |
1640A |
Using the HP 1640A Serial Data Analyzer with the Spectron T-511 Tape Unit |
276 |
1980 |
133X |
Continuous Tone Imaging with Cathode-Ray Tube Displays |
280-1 |
? |
1602A |
Making Complex Measurements with the HP Model 1602A Logic State Analyzer |
280-2 |
1978 |
1602A |
Monitoring the IEEE-488 Bus with the 1602A Logic State Analyzer |
280-3 |
1978 |
1602A |
The 1602A Logic State Analyzer As An Automatic Test Instrument |
280-4 |
1979 |
1602A |
Using 1602A's for Measurements on Wide Buses in Manual and Automatic Modes |
281-1 |
1978 |
HP1000 |
A Way to Get Higher Performance from HP 1000 Computers |
281-2 |
1978 |
HP1000 |
HP 1000 M-Series to E-Series Microprogram Conversion |
281-3 |
1978 |
HP1000 |
Using the HP 1000 E-Series Microprogrammable Processor Port |
282-1 |
1978 |
6940B |
6940B Multiprogrammer System Throughput Analysis for Multiprogrammer Systems Using the 9825A Desktop Computer |
283-1 |
1981 |
8662A |
Applications and Measurements of Low Phase Noise Signals Using the 8662A Synthesized Signal Generator |
283-2 |
1979 |
11721A |
External Frequency Doubling of the 8662A Synthesized Signal Generator |
283-3 |
? |
8662A-8663A |
Low Phase Noise Applications of the HP 8662A and 8663A Synthesized Signal Generators |
285 |
1979 |
4904A-4930A |
Successful Buried Cable Fault Locating |
286-1 |
1980 |
8901A |
Applications and Operation of the 8901A Modulation Analyzer |
287-1 |
? |
5328A |
Waveform Analysis Using the 5328A Universal Frequency Counter |
287-2 |
? |
5345A-5359A |
Frequency Profile Using an HP 5345A Electronic Frequency Counter and an HP 5359A Time Synthesizer |
287-3 |
? |
5370A-5359A |
Frequency Profile Using an HP 5370A Universal Time Interval Counter and an HP 5359A Time Synthesizer |
289 |
1979 |
8165A |
A Stimulus for Automatic Test |
290 |
1980 |
- |
Practical Temperature Measurements |
290 |
1997 |
- |
Practical Temperature Measurements |
290-1 |
1987 |
- |
Practical Strain Gage Measurements |
290-2 |
1982 |
3497A |
Using the HP 3497A to Control Industrial Wastewater Treatment |
290-2 |
1983 |
3497A |
Utilisation du HP 3497A pour le contrôle-Commande du Traitement des Eaux Résiduaires Industrielles (French Translation of AN 290-2) |
291-1 |
1979 |
5345A-5355A |
Application Guide to the 5355/56 Automatic Frequency Converter |
292 |
1979 |
1610A-HP1000 |
Minicomputer Analysis Techniques Using Logic Analyzers |
292-1 |
1981 |
1610A-1615A |
Funtional Analysis of the IEEE-488 Interface Bus |
293 |
? |
1611A |
Funtional Analysis of Microprocessor Systems with the 1611A Option 001 General Purpose Module |
294 |
1979 |
8754A-9825A |
Semi-Automatic R.F. Network Measurements Using the HP 8754A Network Analyzer and the HP 9825A Desktop Computer |
296 |
1980 |
8170A |
An Apllications Guide for the 8170A Logic Pattern Generator |
296-1 |
1980 |
8170A |
8170A Logic Pattern Generator Simulates Multi-Channel Serial Data |
297-1 |
1981 |
8161A |
8161A Programmable Pulse Generator |
297-2 |
1981 |
8161A-5370A |
8161A Automated Reverse Recovery Time Measurements of Diodes |
298-2 |
1981 |
64100A |
Software Project Management with HP 64000 Logic Development System |
299 |
1980 |
1336A |
Interfacing HP's Model 1336A Display to High-Resolution Imaging Systems |
300 |
1980 |
89XX-HP85 |
High Performance Semi-Automatic Transceiver Testing |
301-1 |
1980 |
10544-10811 |
Low Noise Division of 10 MHz Oscillators |
302-1 |
1980 |
4191A |
Direct Radio Frequency Impedance Measurements Using the 4191A RF Impedance Analyzer |
302-2 |
1981 |
4191A |
Impedance Characterization of High Q Devices from 1MHz to 1000MHz with 1Hz Resolution Using the 4191A RF Impedance Analyzer |
308-1 |
1980 |
3060A |
Dynamic Digital Board Testing with the HP Model 3060A Option 100 |
309-1 |
1981 |
3060A |
Static Digital Testing Using the HP 3060A Board Test System |
309-2 |
1981 |
3060A |
Networking your Computer to the HP 3060A Board Test System |
311 |
1981 |
- |
Economics of IC Testing at Incoming Inspection |
312-1 |
1981 |
8350-8709 |
Configuration of a Two-Tone Sweeping Generator 8350A/8620C Sweep Oscillators |
313-1 |
? |
5180A |
Troubleshooting Microprocessor-Based Systems Using the 5180A Waveform Recorder and a Logic Analyzer |
313-2 |
? |
5180A-85XX |
Teaming Up a 5180A Waveform Recorder and a Spectrum Analyzer for New Time-Domain Measurement Capabilities |
313-3 |
? |
5180A |
Using the 5180A Waveform Recorder to Measure Microwave VCO Settling Time and Post Tuning Drift |
313-4 |
? |
5180A-5359A |
Extending Frequency Range and Increasing Effective Sample Rate on the 5180A Waveform Recorder |
313-5 |
? |
5180A |
Power Supply Testing with the 5180A Waveform Recorder |
313-6 |
? |
5180A-5359A |
Recording Sonar and Other Signals Using the 5180A's Toggle Mode |
313-7 |
? |
5180A-3325A |
Interconnecting Two or More 5180A Waveform Recorders to Obtain Multiple Input Channels |
313-8 |
? |
5180A-9826 |
Using the Direct Memory Access Capability of the 5180A Waveform Recorder with the 9826 Desktop Computer |
313-9 |
? |
5180A-8112A |
Using the 5180A Waveform Recorder to Evaluate Floppy Disc Media and Drive Electronics |
313-10 |
1988 |
5185A-5185T |
HP 5181A Waveform Recorder - HP 5185T Digitizing Oscilloscope - Radar System Characterization and Testing |
313-11 |
1988 |
5185T |
Using Digital Filtering Techniques to Improve Analog-to-Digital Converter Measurements |
314 |
1981 |
1741A |
Variable-Persistence Aids Signal Display (Reprint from EDN Magazine) |
314-1 |
1986 |
8770S |
Receiver Testing with the 8770S Arbitrary Waveform Synthesizer System |
314-2 |
1986 |
8770S |
Synthesizing Magnetic Disc Read and Servo Signals with the HP 8770S Arbitrary Waveform Synthesizer System |
314-3 |
1986 |
8770S |
Television Signal Simulation with the HP 8770S Arbitrary Waveform Synthesizer System |
314-4 |
1987 |
8770A-8780A |
Exceptionally-Complex Signal Simulation for Multi-Signal Environments in Radar/EW Test |
315 |
1985 |
4145A |
DC Parametric Analysis of Semiconductor Devices |
315 |
1992 |
4145B |
Practical Applications of the HP 4145B Semiconductor Parameter Analyzer - DC Parametric Analysis of Semiconductor Devices |
316-3 |
1982 |
6942A |
High Speed FET Scanning with the 6942A Multiprogrammer |
317 |
1982 |
4193A-9845B |
Practical Design and Evaluation of High Frequency Circuits Using the HP 4193A Vector Impedance Meter |
319 |
1982 |
818X |
Parametric Characterization of Digital Circuits Up to 50 MHz |
322 |
1983 |
4280A |
Analysis of Semiconductor Capacitance Characteristics Using the HP 4280A 1MHz C Meter / C-V Plotter |
323 |
1983 |
3746A |
Detection of High Level Signals in FDM Networks |
324-1 |
1983 |
445XX |
Understanding Your Bed-of-Nails Test Fixture |
325-2 |
? |
5528A |
Machine Tool Calibration - Laser Measurement System 5528A - HP85 |
325-12 |
1990 |
5517B-10705A |
Non-Contact Measurements with Laser Interferometers |
326 |
1986 |
- |
Principles of Microwave Connector Care (For Higher Reliability and Better Measurements) |
328-1 |
1983 |
3488A ++ |
Practical Test System Signal Switching |
329 |
1983 |
86XX-83XX |
Performance Characteristics of HP Microwave Signal Sources - A Comparison |
329 |
1986 |
86XX-83XX |
Microwave Signal Sources Spectral Purity Characteristics of HP Microwave Signal Sources |
330-1 |
1985 |
8566-9836 |
Automatic MIL-STD EMI Testing Using the HP 85864A/B EMI Measurement Software |
331-1 |
1986 |
8566-85650A |
Automatic CISPR EMI Testing For Conductef Emissions Using the HP 85864A/B EMI Measurement Software |
332 |
1984 |
11713A-333XX |
Microwave Switching From SPDT to Full Access Matrix |
333 |
1984 |
3054A |
Monitoring of a Solar Collector and Heat Reclamation Heating System |
334 |
1984 |
4063A |
Automation of Semiconductor Parameter Analysis - Practical Applications of the HP 4063A Semiconductor Parameter Analysis System |
339 |
1985 |
4194A |
Parametric Analysis for Electronic Components and Circuit Evaluation Using the 4194A Impedance / Gain-Phase Analyzer |
339-1 |
1985 |
4194A |
Impedance Characterisation of Resonators Using the 4194A Impedance / Gain-Phase Analyzer |
339-2 |
1986 |
4194A |
Characteristic Impedance Measurement of PC Board Circuit Patterns - HP 4194A Application Information |
339-3 |
1986 |
4194A |
Crosstalk and Impedance Measurements of PC Board Patterns - HP 4194A Application Information |
339-4 |
1986 |
4194A |
Measuring the Characteristic Impedance of Balanced Cables - HP 4194A Application Information |
339-5 |
1986 |
4194A |
Multi-Frequency C-V Measurements and Doping Profile Analysis of Semiconductors - HP 4194A Application Information |
339-6 |
? |
4194A |
Static Head Testing of Disk Drives - HP 4194A Application Information |
339-7 |
1987 |
4194A |
Efficient Evaluation of LISNs and Voltage Probes for EMI Tests - HP 4194A Impedance / Gain-Phase Analyzer |
339-8 |
1987 |
4194A |
Constant Current Measurements Using the HP 4194A - HP 4194A Impedance / Gain-Phase Analyzer |
339-9 |
1987 |
4194A |
Negative Impedance Measurements of Crystal Oscillators - HP 4194A Impedance / Gain-Phase Analyzer |
339-10 |
1987 |
4194A |
Input / Output and Reflection Coefficient Measurements - HP 4194A Impedance / Gain-Phase Analyzer |
339-11 |
1987 |
4194A |
Filter Test for Production and Incoming Inspection - HP 4194A Impedance / Gain-Phase Analyzer |
339-13 |
1987 |
4194A |
Measuring the dielectric Constant of Solid Materials - HP 4194A Impedance / Gain-Phase Analyzer |
339-14 |
1988 |
4194A |
Testing Switching Power Supplies Using the HP 4194A |
339-20 |
1987 |
414X |
Role of DC Parametric Test in High Speed Digital and Microwave Semiconductor Component Manufacturing |
340-1 |
1990 |
- |
Reducing Fixture-Induced Test Failures |
341-1 |
? |
1630G-8175A |
Testing a Complex LSI / VLSI IC with a Low-Cost Measurement Set-UP |
341-2 |
? |
8175A |
Simulating Sensor Signals - Calibrating and Testing an IR Detecting System with the HP 8175A |
343-1 |
1986 |
8780A-8980A |
Vector Modulation Measurements - Measurement Applications for Digital Microwave Radio |
343-2 |
1988 |
8780A-8981A |
Dynamic Component Test Using Vector Modulation Analysis |
343-3 |
1986 |
8780A-8980A |
Vector Modulation Measurements - Coherent Pulsed Tests of Radar and Electronic Warfare Systems |
343-4 |
1987 |
8980A |
Measuring Demodulator Image Rejection Using the HP 8980A Vector Analyzer |
343-5 |
1988 |
8780A-8770A |
Calibrated Microwave System for Complex Arbitrary Signal Simulation Using HP 8780A and HP 8770A Arbitrary Waveform Synthesizer |
343-6 |
1989 |
878X-3708A |
Testing Digital Microwave Receivers Using a Calibrated Source |
344 |
1986 |
54100A-D |
Bandwidth and Sampling Rate in Digitizing Oscilloscopes |
345-1 |
1986 |
8757A ++ |
Amplifier Measurements Using the Scalar Network Analyzer |
345-2 |
1987 |
8757A ++ |
Mixer Measurements Using the Scalar Network Analyzer |
346 |
1986 |
41XX-42XX |
A Guideline for Designing External DC Bias Circuits for the HP 4192A, 4194A, 4274A, 4275A, 4276A, 4277A |
346-2 |
1992 |
4194A-4195A |
Balanced Circuit Measurement wth an Impedance Meter / LCR Meter / Network Analyzer |
346-3 |
1992 |
4285A |
Effective Impedance Measurement Using OPEN / SHORT / LOAD Correction |
348 |
1986 |
- |
Voltage and Time Resolution in Digitizing Oscilloscopes |
349 |
1986 |
- |
PC Instruments Applications Handbook - Explore Ways to Improve Your Test and Measurement Productivity |
351 |
1987 |
8753A |
Characterization of High-Speed Optical Components with an RF Network Analyzer |
355A |
1992 |
37XX |
Digital Radio Theory and Measurements |
355-1 |
1992 |
37XX-8590A |
A Description of the Wide Range of Test Solutions Available From HP for Digital Radio Test |
356 |
1987 |
4142B-S300 |
HP 4142B Modular DC Source / Monitor Practical Applications - High Speed DC Characterisation of Semiconductor Devices Sub pA to 1A |
356-1 |
1988 |
4142B-S300 |
HP 4142B Modular DC Source / Monitor Practical Applications - Techniques and Applications for High Throughput and Stable Characterization |
357-3 |
1988 |
4195A |
Advanced Filter Evaluation and Limit Testing with HP 4195A Network / Spectrum Analyzer |
357-4 |
1989 |
4195A |
Testing Magnetic Disk Read Circuits Using the HP 4195A |
358-1 |
1987 |
5371A |
HP 5371A Frequency and Time Interval Analyzer - Characterization of Frequency-Agile Signal Sources |
358-2 |
1987 |
5371A |
HP 5371A Frequency and Time Interval Analyzer - Jitter and Wander Analysis in Digital Communications |
358-3 |
1988 |
5371A |
HP 5371A Frequency and Time Interval Analyzer - Time Domain Characterization of Magnetic Disk Drives |
358-4 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Pre-Trigger Simplifies VCO Step Response Measurements |
358-5 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Clock Rate Independent Jitter Measurements for Digital Communications Systems |
358-5 |
1990 |
5372A |
Mesure de Gigue Indépendante de la Vitesse d'Horloge pour les Systèmes de Transmission Numériques (French Translation of AN 358-5) |
358-6 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Characterizing Transient Timing Errors in Disk and Tape Drives |
358-7 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Analysing Phase-Locked Loop Transients in the Modulation Domain |
358-8 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Single Shot BPSK Signal Characterization |
358-9 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Modulation Domain Techniques for Measuring Complex Radar Signals |
358-9 |
1991 |
5372A |
Technique de Mesure de Signaux Radar Complexes dans le Domaine de Modulation (French Translation of AN 358-9) |
358-10 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Characterizing Baker Coded Modulation in Radar Systems |
358-11 |
1989 |
5372A |
HP 5372A Frequency and Time Interval Analyzer - Characterizing Shirp Coded Modulation in Radar Systems |
358-12 |
1990 |
5371A-5372A |
Simplifiez les Mesures de Stabilité en Fréquence à l'Aide de l'Analyse de Variance d'Allan Intégrée (French Translation of AN 358-12) |
358-13 |
1990 |
5372A |
Analysing Phase-Locked Loop Capture and Tracking Range |
360 |
1987 |
378X |
Jitter Tolerance Testing Using Phase or Frequency Modulated Sources and Bit Error Rate Test Sets |
361 |
1988 |
815X |
Traceability of Optical Power Measurements - How Traceability to National Standards is Provided by Hewlett-Packard |
362 |
1988 |
815X-3764A |
Bit Error Rate Measurements on Optical Fiber Systems |
364-2 |
1990 |
3709B |
Digital Radio Testing with British Telecom |
366-1 |
1986 |
815X-8145A |
How to Measure Insertion Loss of Optical Components |
366-2 |
1988 |
815X |
How to Measure Return Loss of Optical Components |
366-3 |
1988 |
8145A |
How to Measure Return Loss in Optical Links Using the HP 8145A OTDR |
369-1 |
1988 |
4284A |
Optimizing Electronic Component and Material Impedance Measurements Taking Full Advantage of the HP 4284A Precision LCR Meter |
369-2 |
1988 |
4284A |
Tantalum Electrolytic Capacitor Measurements in Production and Quality Control Departments - HP 4284A Precision LCR Meter |
369-3 |
1988 |
4284A |
Impedance Measurements of Magnetic Heads Using Constant Current in Production and Quality Control Departments |
369-4 |
1988 |
4284A |
Recommending Electronic Manufacturers to Perform Incomming Inspection - HP 4284A Precision LCR Meter |
369-5 |
1988 |
4284A |
Multi-Frequency C-V Measurements of Semiconductors - HP 4284A Precision LCR Meter |
369-6 |
1988 |
4284A |
Impedance Testing Using Scanner - HP 4284A Precision LCR Meter |
369-7 |
1988 |
4284A |
Measurement of Capacitance Characteristics of Liquid Crystal Cell with HP 4284A Precision LCR Meter |
369-8 |
1989 |
4284A-42841A |
Wide Range DC Current Biased Inductance Measurement with HP 4284A Precision LCR Meter / HP 42841A Bias Current Source |
369-9 |
1989 |
4284A-4285A |
Improve Electronic Product Quality and Performance with HP Precision LCR Meters - HP 4284A and HP 4285A Precision LCR Meters |
371 |
1992 |
71400 |
HP 71400 Lightwave Signal Analyzer - Measuring Modulated Light |
372-1 |
1988 |
60XX |
Power Supply Testing |
372-2 |
1988 |
60XX |
Battery Testing |
372-3 |
1988 |
60XX-66XX |
Power Components Testing |
374-1 |
1988 |
8510B-8340B |
Antenna Measurements - Manual Pattern Measurements Using the HP 8510B |
376-1 |
1988 |
662X |
Biasing Three-Terminal Devices for Test - A precise Solution for Component Evaluation and Sub-Assembly Testing… |
377-1 |
1989 |
5361A |
Automatic Frequency Profiling of Chirped Radar Pulses Using the HP 5361A 20 GHz Pulse / CW Microwave Counter |
377-2 |
1989 |
5361A |
Automatic Characterization of Microwave VCO's Using the HP 5361A 20 GHz Pulse / CW Microwave Counter |
377-3 |
1989 |
5361A |
Frequency Profiling Without a Pulse Generator Using the HP 5361A 20 GHz Pulse / CW Microwave Counter's Built-In Profiling |
377-4 |
1990 |
5361B |
Frequency and Phase Profiling Simplified with the HP 5361B Pulse / CW Microwave Counter |
378-1 |
1989 |
3585B |
Harmonic Distorsion Measurements - Enhancing Speed and Performance with Spectrum Analysis |
379-1 |
1989 |
11757A |
Measuring Digital Microwave Radio M-Curves / Signatures |
379-2 |
1990 |
11758T |
Measuring Microwave Radio Antenna Return Loss Using the HP 11758T Digital Radio Test System |
380-1 |
1989 |
16451B |
Dielectric Constant Measurement of Solid Materials Using the HP 16451B Dielectric Test Fixture |
380-2 |
1990 |
4195A-4284A |
Measuring Cable Parameters - HP Precision LCR Meters and Impedance Analyzers |
380-3 |
1995 |
- |
Evalution of Colloids by Dielectric Spectroscopy |
381 |
1989 |
5412X-8131A |
A Test Setup for Characterizing High-Speed Logic Devices |
381 |
1990 |
5412X-8131A |
Configuration de Test pour la Caractérisation des Composants Logiques rapides (French Translation of AN 381) |
381-1 |
1990 |
5412X-8131A |
Configuration de Test pour la Caractérisation d'un Trigger de Schmitt rapide (French Translation of AN 381-1) |
383-1 |
1989 |
4142B |
Simplification of DC Characterization and Analysis of Semiconductor Devices |
383-2 |
1990 |
4142B |
Automation of DC Characterization and Analysis of Semiconductor Devices |
385 |
1989 |
3048A |
Millimeter Measurements Using the HP 3048A Phase Noise Measurement System |
386 |
1990 |
3048A |
Pulsed Carrier Phase Noise Measurements Using the HP 3048A Phase Noise Measurement System |
388 |
1990 |
- |
Signal Generator Spectral Purity |
392-1 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - Aerospace and Defense Applications |
392-2 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - PC and PC Add-On Applications |
392-3 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - VME / VXI Applications |
392-4 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - Workstation / Server Applications |
392-5 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - Computer Peripheral Applications |
392-6 |
1990 |
165XX |
How the Right Preprocessor Interface Can Simplify Logic Analysis - Industrial / Automotive Applications |
393 |
1990 |
3562A |
Monitoring of Ultrasonic Wire Bonding Machines |
397-1 |
1990 |
4951X-4952A |
ISDN Testing Techniques for the HP 4954I and the HP 4951C / HP 4952A WAN Protocol Analyzers |
398-2 |
1990 |
- |
Correlation of Timing Measurements |
417-1 |
1986 |
9000-S200-S300 |
HP Basic I/O Concepts for the HP 9000 Series 200 and Series 300 |
421-1 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Commercial Energy Conservation |
421-2 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Fan Testing |
421-3 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Vehicle Body Testing |
421-4 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Wastewater Treatment |
421-5 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Controler Testing |
421-6 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Internal Combustion Engine Testing |
421-7 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Environmental / Autoclave Testing |
421-8 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Communication Cable Testing |
421-9 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Residential Facility Testing |
421-10 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Canning Process Characterization |
421-11 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Explosion Testing |
421-12 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Materials Development |
421-13 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Plating Line Control |
421-14 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Battery Testing |
421-15 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Pilot Plant Monitoring |
421-16 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Testing |
421-17 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Facility Management |
421-18 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - "Large Product" Characterization |
421-19 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Missile System Testing |
421-20 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Machine Monitoring Control |
421-21 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Pharmaceutical Process Control |
421-22 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Paper Process Characterisation |
421-23 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Rolling Mill |
421-24 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Appliance Testing |
421-25 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Airframe Testing |
421-26 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - On-Road Vehicle Testing |
421-27 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Pumping Station Control |
421-28 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Receiver Testing |
421-29 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Bed-of-Nails Testing for Digital to Analog Converters |
421-30 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Automotive Radios and Engine Controllers |
421-31 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Sonar System Testing |
421-32 |
1987 |
3852-S300-1000 |
Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Electronic Subassemblies |
425 |
1990 |
4951C-4952A |
Le Contrôle et l'Entretien de Votre Réseau X,25 (French Translation of AN 425) |
426 |
1989 |
9000-S300 |
File Sharing Between HP BASIC/WS, HP BASIC/UX, and HP-UX for HP 9000 Series 300 Computers |
907 |
1967 |
- |
The Hot Carrier Diode - Theory, Design and Application |
909 |
1966 |
- |
Electrical Isolation Using the HPA 4310 |
910 |
1968 |
- |
Optoelectronic Coupling for Coding, Multiplexing and Channel Switching |
911 |
? |
- |
Low Level DC Operation Using HP Photochoppers |
912 |
? |
- |
An Attenuator Design Using PIN Diodes - Constant Impedance Current Controlled 10 MHz to 1,0 GHz Bandwidth |
913 |
1967 |
- |
Step Recovery Diode Frequency Multiplier Design |
914 |
1967 |
- |
Biasing and Driving Considerations for PIN Diode RF Switches and Modulators |
915 |
1967 |
- |
Threshold Detection of Visible and Infrared Radiation with PIN Photodiodes |
916 |
1967 |
- |
HPA GaAs Sources |
917 |
1967 |
- |
HPA PIN Photodiode |
918 |
1968 |
- |
Pulse and Waveform Generation with Step Recovery Diodes |
919 |
1968 |
- |
Optmizing Signal-to-Noise Ratio in Photochopper Applications |
920 |
1968 |
- |
Harmonic Generation Using Step Recovery Diodes and SRD Modules |
921 |
? |
- |
The 33800 Series Mixer / Detector Module |
922 |
? |
- |
Applications of PIN Diodes |
923 |
? |
- |
Hot Carrier Diode Video Detectors |
928 |
? |
- |
Ku-Band Step Recovery Multiplier |
929 |
? |
- |
Fast Switching PIN Diodes |
930 |
1970 |
- |
Handling and Assembling HP Transistor Chips |
931 |
1970 |
- |
Solid State Alphanumeric Display - Decoder / Driver Circuitry |
933 |
1970 |
- |
Monolithic Solid State Seven Segment Displays |
935 |
1971 |
- |
Microwave Power Generation and Amplification Using Impatt Diodes |
936 |
1971 |
- |
High Performance PIN Attenuator for Low Cost AGC Applications |
938 |
? |
- |
Solid State Lamp Installation Note |
942 |
1973 |
- |
Shottky Diodes for High Volume, Low Cost Applications |
1011 |
1984 |
- |
Conception et Mise en Œuvre des Codeurs Incrémentiels HEDS-5000 et HEDS-6000 |
1025 |
1985 |
- |
Applications and Circuit Design for the HEDS-7000 Series Digital Potentiometer |
1034 |
1988 |
815X |
How to Make Accurate Fiber Optic Power Measurements |
1200-1 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Simplified Motor Spin-Up Analysis |
1200-2 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Direct Characterization of Motion Control Systems |
1200-3 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - VCO Step Response Analysis Made Easy |
1200-4 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Quick Identification of Periodic Jitter Sources |
1200-5 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Fast Characterization of Pulse Width Encoded Data |
1200-6 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Simple Analysis of Frequency Modulation |
1200-7 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Simplified Analysis of Phase-Locked Loop Capture and Tracking Range |
1200-8 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Single Shoot Frequency Profiling of Chirped Radars Made Easy |
1200-9 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Histograms Simplify Analysis of Random Jitter |
1200-10 |
1990 |
53310A |
HP 53310A Modulation Domain Analyzer - Examine Channel Switching Characteristics of Cellular Radios |
1200-11 |
1993 |
53310A |
HP 53310A Modulation Domain Analyzer - Examine GMSK Modulation in GSM and PCN Mobile Communications Systems |
1200-12 |
1991 |
53310A |
HP 53310A Modulation Domain Analyzer - Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios |
1202-1 |
1990 |
8751A |
HP 8751A Network Analyzer 5Hz to 500MHz - Designing Impedance Matching Networks with the HP 8751A |
1202-2 |
1991 |
8751A |
HP 8751A Network Analyzer 5Hz to 500MHz - 17 Fixtures, Test Sets and Accessories for the HP 8751A |
1202-3 |
1991 |
8751A |
HP 8751A Network Analyzer 5Hz to 500MHz - 3 Steps to Better Baseband, IF and RF Design with the HP 8751A |
1205 |
1991 |
4142B |
Efficient Microwave Bias and Test Using the HP 4142B Modular DC Source / Monitor |
1206-1 |
1991 |
HP Vee |
Complete Data Acquisition Solutions with HP VEE-Test |
1206-2 |
1991 |
HP Vee |
Design Characterization Using HP VEE-Test |
1207-1 |
1991 |
823XX |
Multiprocessing with HP Measurement Coprocessors |
1207-2 |
1991 |
823XX |
Installing Multiple HP Measurement Coprocessors |
1210-1 |
1991 |
4194A |
Characterizing IC Packages with Impedance Measurements and the UTP-3000 Test Fixture |
1210-3 |
1991 |
813X |
Simulating Noise Signals for Tolerance Testing |
1210-5 |
1991 |
54121T |
Characterizing IC Packages with TDR / TDT and the UTP-3000 Test Fixture |
1210-6 |
1991 |
5412X-8131A |
Characterizing Jitter with a Digitizing Oscilloscope |
1210-10 |
1992 |
54720A-8133A |
Timing Considerations in Clock Distribution Networks |
1210-11 |
1992 |
8510-87XX |
Simulation and Optimization Methods for MCM Substrates |
1210-14 |
1992 |
4194A-875X |
Electrical Characterization Methods for MCM Substrates |
1210-16 |
1994 |
- |
Characterizing the Performance of High-Speed Digital-to-Analog Converters |
1211-1 |
1991 |
37722-37732 |
Standard and CRC-4 Frame Testing |
1213 |
1991 |
3588A-3589A |
Better Noise Measurements with the HP 3588A & HP 3589A |
1214 |
1991 |
54510A |
Sequential Single-Shot Optimizes Speed, Memory Depth and Throughput |
1216-1 |
1992 |
4142B |
Performing High-Speed Parameter Extractions on High-Power Devices Using the HP 4142B Modular DC Source / Monitor |
1216-2 |
1992 |
4142B |
An Automated DC Parameter Measurement System for Power Modules and Smart Power ICs Using the HP 4142B Modular DC Source / Monitor |
1217-1 |
1992 |
419X-875X |
Basics of Measuring the Dielectric Properties of Materials |
1218-1 |
1992 |
7145X |
Optical Spectrum Analysis Basics |
1219-1 |
1992 |
82335B |
HP 82335B HP-IB for Windows - Utilizing DDE for Test and Measurement Applications |
1219-2 |
1992 |
82335B |
HP 82335B HP-IB for Windows - Creating Instrument Control Applications with Visual Basic and HP-IB for Windows |
1219-3 |
1992 |
82335B |
HP 82335B HP-IB for Windows - Creating Software Front Panels for Your VXI Instruments |
1221 |
1992 |
54701A |
Differential Measurements on Wideband Signals |
1223 |
1992 |
16550A |
Logic Analyzer Triggering Applications for the HP 16550A 100 MHz State / 500 MHz Timing Module |
1224-1 |
1992 |
4338A-4339A |
Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components |
1224-2 |
1992 |
4339A |
Insulation Resistance Measurements of the Plate Type Materials |
1224-3 |
1992 |
4263A |
Effective Transformers / LF Coils Testing |
1224-4 |
1992 |
4263A |
Effective Electrolytic Capacitors Testing |
1225-1 |
1992 |
16542A |
Imaging and DSP Testing with the HP 16542A |
1225-2 |
1992 |
16542A |
Cache Hit or Miss Analysis with the HP 16542A |
1225-3 |
1992 |
16542A |
Digital Video Testing with the HP 16542A |
1225-4 |
1992 |
16542A |
Analog-to-Digital Converter Testing with the HP 16542A |
1230 |
1992 |
35665A |
Sound Power Measurements |
1237-1 |
1993 |
- |
Maximizing Revenue with In-Service Testing-Introduction |
1241 |
1993 |
54720-1143A |
Microprobing with the Fine-Pitch Active Probe |
1242 |
1992 |
- |
Microprobing Essentials for Fine Pitch Modules |
1245 |
1993 |
16500X |
PC Network Connectivity with the HP 16500L Interface Module |
1246 |
1993 |
6060B |
Pulsed Characterization of Power Semiconductors Using Electronic Loads |
1253 |
1994 |
VXI |
Real-Time System Measures Aircraft Flight Characteristics |
1260-1 |
1993 |
4396A |
Combining Network and Spectrum Analysis and IBASIC to Improve Device Characterization and Test Time |
1266-1 |
1994 |
16500X |
Intel 80960CA Software Debug Using a Logic Analyzer and an In-Circuit Debugger |
1267 |
1995 |
71501B-703XX |
Frequency Agile Jitter Measurement System |
1270-1 |
1995 |
VXI ++ |
Final Test and Alignment for Cellular Phones & Failure Analysis and Repair for Cellular Phones |
1270-2 |
1995 |
VXI ++ |
VHF Transceiver Testing |
1270-3 |
1995 |
VXI ++ |
Prototype Aircraft Jet Engine Characterization and Test |
1270-4 |
1995 |
VXI ++ |
Electronic Heater Valves Testing |
1270-5 |
1995 |
VXI ++ |
Vehicle Body Testing |
1270-6 |
1995 |
VXI ++ |
On Road Vehicle Testing |
1270-7 |
1995 |
VXI ++ |
Communication Cable Testing |
1270-8 |
1995 |
VXI ++ |
Airframe Testing |
1270-9 |
1995 |
VXI ++ |
Jet Engine Controller Testing |
1270-10 |
1995 |
VXI ++ |
Jet Engine Testing |
1270-11 |
1995 |
VXI ++ |
Environmental Test of Automotive Radios and Engine Controllers |
1270-12 |
1995 |
VXI ++ |
Automotive Relay Modules Testing |
1272 |
1996 |
58503A-59551A |
GPS and Precision Timing Applications |
1273 |
1995 |
6840 |
Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards |
1279 |
1996 |
5071A-58503A |
HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications |
1279 |
1998 |
5071A-58503A |
HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications |
1286-1 |
1997 |
856X-859X |
8 Astuces pour Améliorer vos Analyses de Spectre (French Translation of AN 1286-1) |
1287-1 |
1997 |
87XX |
Understanding the Fundamental Principles of Vector Network Analysis |
1287-2 |
1997 |
87XX |
Exploring the Architectures of Network Analyzers |
1287-3 |
1997 |
87XX |
Applying Error Correction to Network Analyzer Measurements |
1287-4 |
1997 |
87XX |
Network Analyzer Measurements: Filter and Amplifier Examples |
1287-7 |
1998 |
87XX |
Improving Network Analyzer Measurements of Frequency-Translating Devices |
1288-1 |
1997 |
4396B |
Combining Network and Spectrum Analyses and IBASIC to Improve Device Characterization and Test Time |
1288-2 |
1994 |
4396B |
Configuring the HP 4396B for Optical / Electrical Testing |
1288-4 |
1997 |
4396B |
How to Characterize CATV Amplifiers Effectively |
1289 |
1997 |
- |
The Science of TimeKeeping |
1291-1 |
1997 |
87XX-8510 |
8 Hints for Making Better Network Analyzer Measurements |
1293 |
1997 |
E435X |
Sequential Shunt Regulation - Regulating Satellite Bus Voltage |
1296 |
1997 |
- |
LMDS - The Wireless Interactive Broadband Access Service |
1297 |
1997 |
42XX-43XX-87XX |
Solution for Measuring Permittivity and Permeability - Meeting Tomorrow's Material Test Challenges |
1298 |
1997 |
- |
Digital Modulation in Communications Systems - An Introduction |
1299 |
1997 |
37778A-71451B |
Introduction to BER Testing of WDM Systems |
1303 |
1998 |
859X-856X |
Spectrum Analyzer Measurements and Noise - Measuring Noise and Noise-Like Digital Communications Signals with a Spectrum Analyzer |
1304-2 |
1988 |
54750A-83480A |
Time Domain Reflectometry Theory |
1304-4 |
2000 |
54750A |
Measuring Characteristic Impedance of Short RAMBUS Motherboard Traces and Small-Outline RIMM's |
1307 |
1998 |
87XX-85XX |
Testing CDMA Base Station Amplifiers - Measurements Fundamentals of Characterizing the Linear and Non-Linear Behavior of CDMA Amplifiers |
1308-1 |
1998 |
4395A-4396A |
Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components |
1310 |
1999 |
- |
Mobile Communications Device Testing - Considerations when Selecting a System Power Supply |
1313 |
2000 |
- |
Agilent Technologies Wireless Test Solutions - Testing and Troubleshooting Digital RF Communications Transmitter Designs |
1323 |
2000 |
- |
Internet Advisor - Testing and Troubleshooting Medium and High Speed Frame Relay Networks |
1333 |
1999 |
- |
Performing Bluetooth RF Measurements Today |
1333 |
2000 |
- |
Agilent - Performing Bluetooth RF Measurements Today |
1370-1 |
2000 |
HP Vee |
Data Logging Using Remote Programming |
1550-6 |
1992 |
8702-8703 |
High-Speed Lightwave Component Analysis |